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2015-11-01·International Symposium for Testing and Failure Analysis
WISE and ICARUS—New X-Ray Algorithms to Improve the Detection of Counterfeit Components
作者: Cardoso, Bill
AbstractThe drive towards miniaturization has created increasing challenges to the overall failure analysis and quality inspection of electronic devices. This trend has equally challenged the image quality of x-ray inspection systems – engineers need to see more details in each inspection. Image quality is paramount to the ability of making actionable decisions on the information acquired from an x-ray machine. Previous generations of x-ray technologies have focused on hardware improvements – better x-ray sources and better x-ray sensors. Although further improvements can still be achieved in hardware, our focus will be on the latest wave of technology breakthroughs and innovation in radiography systems: algorithms.
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